AZtecCrystal 4.0: Advanced EBSD Data Processing Software
AZtecCrystal 4.0 is the latest generation of Oxford Instruments’ electron backscatter diffraction (EBSD) analysis software, designed for processing high-speed EBSD data from modern CMOS detectors . This version introduces three powerful new features that enhance researchers’ ability to evaluate and visualize complex EBSD datasets .
Key New Features in Version 4.0
Crystal Batch (Batch Processing)
Apply all of AZtecCrystal’s processing power to hundreds of map layers in a single operation . Ideal for 3D FIB slice analysis, in-situ experiments, quality control, and multi-sample workflows . External experimental parameters (temperature, load, extension) can be linked to synchronize EBSD metrics across multiple datasets .
Crystal Compare (Data Stack Visualization)
View and compare stacked datasets dynamically for the first time . Connect external experimental parameters to individual map layers and create time-lapse videos to visualize dynamic changes across datasets .
STAMP Tool (Data Tagging)
Add external data to raw H5OINA files automatically using filename information or manual import .
Core Capabilities
| Category | Features |
|---|---|
| Grain Analysis | High-speed algorithms measuring 20,000 grains in <15 seconds; ASTM E2627 grain size reporting |
| Texture Analysis | Pole figures, inverse pole figures, ODF analysis |
| Boundary Analysis | Full boundary characterization, special boundaries (CSL, twins), grain boundary engineering tools |
| Map Display | Unlimited customizable map layers with linked tile display |
| MapSweeper | Pattern matching re-indexing, refinement, and repair using stored EBSPs |
| Classification Tool | Machine-learning classification of microstructure constituents |
| Strain Analysis | Pattern matching for routine strain analysis |