EDAX OIM Analysis 9.0

EDAX OIM Analysis 9.0 | Advanced Electron Backscatter Diffraction (EBSD) Data Analysis Software

EDAX OIM Analysis 9.0 is a premier software package for processing, analyzing, and visualizing crystallographic orientation and microstructural data obtained from Electron Backscatter Diffraction (EBSD) systems. It provides materials scientists and metallurgists with comprehensive tools for quantitative microstructural characterization.

Core Functionality Overview:

• Comprehensive EBSD Data Processing: Advanced tools for indexing diffraction patterns, cleaning orientation data, phase identification, and calculating microstructural parameters like grain size, texture (pole figures, ODF), and misorientation.

• Advanced Microstructural & Crystallographic Analysis: Features specialized modules for analyzing deformation (kernel average misorientation – KAM), recrystallization, phase distribution, and correlative microscopy with EDS data.

• High-Quality Visualization & Reporting: Generates detailed maps (IPF, phase, band contrast), charts, and customizable reports for publication-quality presentation of microstructural and texture data.