PC-DMIS 2025.1.20: The Global Standard for CMM Measurement Software
Achieve unparalleled precision and efficiency in dimensional inspection with PC-DMIS 2025.1.20, the world’s leading software for Coordinate Measuring Machines. This latest version provides metrologists and quality engineers with a powerful, unified platform for programming, executing, and analyzing complex measurement routines across all major CMM brands and sensor types. Download PC-DMIS 2025.1.20 to streamline your quality control process and ensure manufacturing perfection.
Core Features of PC-DMIS 2025.1.20
PC-DMIS 2025.1.20 integrates advanced measurement capabilities with a user-friendly interface, making it the most comprehensive metrology solution available.
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Unified Multi-CMM and Multi-Sensor Support
Standardize your entire inspection workflow across different hardware. The software seamlessly supports contact trigger probes, scanning probes, vision systems, and laser trackers from all major manufacturers from a single, familiar interface. -
Powerful CAD-Based Programming
Drastically reduce programming time with direct CAD import and association. Create measurement routines directly on the 3D CAD model for intuitive offline programming, ensuring a seamless digital thread from design to inspection. -
Advanced Alignment and Best-Fit Algorithms
Accurately align complex parts with powerful alignment routines like Iterative Closest Point and RPS (Reference Point System). These features are crucial for inspecting free-form surfaces and assemblies, minimizing setup time and human error. -
Comprehensive GD&T and Reporting Engine
Generate fully compliant Geometric Dimensioning and Tolerancing reports with ease. The software automatically calculates and documents all standard GD&T characteristics, creating clear, professional reports for customers and regulatory bodies. -
Enhanced Automation and Customization
Automate repetitive tasks and create custom applications with PC-DMIS’s robust programming and scripting environment. This allows for high-throughput inspection cells and the development of tailored solutions for unique measurement challenges.
