EDAX OIM Analysis 9.1: The Essential Software for EBSD Data Interpretation
EDAX OIM Analysis 9.1 (Orientation Imaging Microscopy) is the dedicated analysis suite for processing, visualizing, and quantifying data acquired from Electron Backscatter Diffraction (EBSD) systems, primarily from EDAX/AMETEK. It is the critical software for materials scientists and metallurgists to transform raw diffraction patterns into comprehensive, quantitative maps of a material’s crystallographic microstructure.
Core Function: From Diffraction Patterns to Crystallographic Maps
The software’s primary role is to index the Kikuchi diffraction patterns captured by the EBSD detector at each point on a sample scan. It calculates the crystal orientation and phase at each point, compiling this data into detailed maps that reveal grain structure, texture (preferred orientation), and phase distribution.
Key Functions:
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Data Processing & Cleanup: Applies advanced algorithms for indexing, phase identification, and data cleanup (noise reduction, wild spike correction, grain dilation) to ensure high-quality, reliable results.
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Comprehensive Visualization: Generates a wide variety of maps: Inverse Pole Figure (IPF) maps for crystal orientation, Image Quality (IQ) maps for grain boundaries and defects, Phase Maps, and Kernel Average Misorientation (KAM) maps for strain analysis.
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Quantitative Analysis: Extracts statistical data such as grain size distribution, grain boundary character, texture (pole figures, ODFs), and phase area fractions.
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Advanced Analysis Tools: Includes tools for analyzing special boundaries (e.g., CSL boundaries), performing crystallographic calculations, and correlating EBSD data with Energy Dispersive Spectroscopy (EDS) elemental maps.
